ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,096, issued on April 7, was assigned to Cirrus Logic Inc. (Austin, Texas). "Electrochemical cell characterisation" was invented by James We... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,097, issued on April 7, was assigned to NANJING GENSCRIPT BIOTECH Co. LTD. (Nanjing, China). "Optical element detachable capillary clip and... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,098, issued on April 7, was assigned to Roche Sequencing Solutions Inc. (Pleasanton, Calif.). "Device for volume coupling in epitachophores... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,099, issued on April 7, was assigned to Sharp Display Technology Corp. (Kameyama City, Japan). "Detector" was invented by Kei Ikuta (Kameya... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,100, issued on April 7, was assigned to WEIHAI HUALING OPTO-ELECTRONICS Co. LTD. (Weihai, China). "Device for detecting defect in steel cor... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,101, issued on April 7, was assigned to ROSEMOUNT TANK RADAR AB (Molnlycke, Sweden). "Vibrating fork type field device with coil arrangemen... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,102, issued on April 7, was assigned to Qorvo US Inc. (Greensboro, N.C.). "Resonator structure for mass sensing" was invented by James Webs... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,103, issued on April 7, was assigned to LIMINAL INSIGHTS INC. (Emeryville, Calif.). "Fixturing mechanism with load sensors for acoustic tes... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,104, issued on April 7, was assigned to GUANGDONG UNIVERSITY OF TECHNOLOGY (Guangzhou, China). "Device and method for detecting fitting deg... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,105, issued on April 7, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Defect inspection apparatus and defect inspection method" was inven... Read More