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US Patent Issued to TOTO on July 21 for "Structural member" (Japanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,007, issued on July 21, was assigned to TOTO Ltd. (Fukuoka, Japan). "Structural member" was invented by Morio Hosokawa (Fukuoka, Japan) and... Read More


US Patent Issued to Tokyo Electron on July 21 for "Substrate transfer system and transfer module" (Japanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,009, issued on July 21, was assigned to Tokyo Electron Ltd. (Tokyo). "Substrate transfer system and transfer module" was invented by Toshia... Read More


US Patent Issued to Applied Materials on July 21 for "High efficiency trap for particle collection in a vacuum foreline" (California Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,010, issued on July 21, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "High efficiency trap for particle collection in a va... Read More


US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on July 21 for "Apparatus with heated filter and operation method of the same" (Taiwanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,011, issued on July 21, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Apparatus with heated filter an... Read More


US Patent Issued to Tokyo Electron on July 21 for "Ignition condition calculation method and plasma processing apparatus" (Japanese Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,012, issued on July 21, was assigned to Tokyo Electron Ltd. (Tokyo). "Ignition condition calculation method and plasma processing apparatus... Read More


US Patent Issued to Tokyo Electron on July 21 for "Measuring device, measuring method, and vacuum processing apparatus" (Japanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,013, issued on July 21, was assigned to Tokyo Electron Ltd. (Tokyo). "Measuring device, measuring method, and vacuum processing apparatus" ... Read More


US Patent Issued to DH Technologies Development on July 21 for "Sampling system for an open port probe" (Canadian Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,014, issued on July 21, was assigned to DH Technologies Development Pte. Ltd. (Singapore). "Sampling system for an open port probe" was inv... Read More


US Patent Issued to DH Technologies Development on July 21 for "Planar ion processing station" (Canadian Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,015, issued on July 21, was assigned to DH Technologies Development Pte. Ltd. (Singapore). "Planar ion processing station" was invented by ... Read More


US Patent Issued to SHIMADZU on July 21 for "Method for mass spectrometry and mass spectrometer" (Japanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,016, issued on July 21, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Method for mass spectrometry and mass spectrometer" was invented by... Read More


US Patent Issued to SHIMADZU on July 21 for "Mass spectrometer" (Japanese Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,017, issued on July 21, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Mass spectrometer" was invented by Shiro Mizutani (Kyoto, Japan). ... Read More